Cereal Chem 67:139-140   |  VIEW ARTICLE

Comparison of Two Sample Preparation Procedures for Low-Temperature Scanning Electron Microscopy of Frozen Bread Dough.

P. T. Berglund, D. R. Shelton, and T. P. Freeman. Copyright 1990 by the American Association of Cereal Chemists, Inc. 

New development in low-temperature scanning electron microscopy (LT-SEM) allow samples to be examined in a frozen, fully hydrated state. We studied the effect of sample preparation procedure for LT- SEM on resulting ultrastructure of frozen bread dough. Frozen doughs that thawed during SEM preparation exhibited a reticular pattern that was not apparent when samples remained frozen. The procedure used for preparing samples to be examined by LT-SEM is critical in determining the ultra-structural nature of frozen products.