January
1998
Volume
75
Number
1
Pages
142
—
144
Authors
F. E.
Dowell
1
Affiliations
Agricultural Engineer, USDA ARS Grain Marketing and Production Research Center, 1515 College Ave., Manhattan, KS 66502. Mention of trademark or proprietary products does not constitute a guarantee or warranty by the U.S. Department of Agriculture and does not imply its approval to the exclusion of other products that may also be suitable.
Go to Article:
RelatedArticle
Accepted October 21, 1997.
Abstract
ABSTRACT
Modification of an existing single kernel wheat characterization system allowed collection of visible and near-infrared (NIR) reflectance spectra (450–1,688 nm) at a rate of 1 kernel/4 sec. The spectral information was used to classify red and white wheats in an attempt to remove subjectivity from class determinations. Calibration, validation, and prediction results showed that calibrations using partial least squares regression and derived from the full wavelength profile correctly classed more kernels than either the visible region (450–700 nm) or the NIR region (700–1,688 nm). Most results showed >99% correct classification for single kernels when using the visible and NIR regions. Averaging of single kernel classifications resulted in 100% correct classification of bulk samples.
JnArticleKeywords
ArticleCopyright
This article is in the public domain and not copyrightable. It may be freely reprinted with customary crediting of the source. American Association of Cereal Chemists, Inc., 1998.