September
1997
Volume
74
Number
5
Pages
617
—
620
Authors
F. E.
Dowell
1
Affiliations
Grain and Marketing Production Research Center, ARS, USDA, Manhattan, KS 66502. Mention of trademark or proprietary product does not constitute a guarantee or warranty of the product by the U.S. Department of Agriculture and does not imply its approval to the exclusion of other products that may also be suitable.
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Accepted May 14, 1997.
Abstract
ABSTRACT
A diode-array system, which measures spectral reflectance from 400 to 700 nm, was used to quantify single wheat kernel color before and after soaking in NaOH as a means of determining color class. Wheat color classification is currently a subjective determination and important in determining the end-use of the wheat. Soaking kernels in NaOH and classifying the soaked kernels with the diode-array system resulted in more difficult-to-classify kernels correctly classified (98.1%) than the visual method of classifying kernels (74.8%). Kernel orientation had a slight effect on correct classification, with the side view correctly classifying more kernels than the dorsal or crease view. The diode-array system provided a means of quantifying kernel color and eliminated inspector subjectivity when determining color class.
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ArticleCopyright
This article is in the public domain and not copyrightable. It may be freely reprinted with customary crediting of the source. American Association of Cereal Chemists, Inc., 1997.